Electrical Characterization

This guide explains the theory behind sheet resistance, an electrical property of thin films of materials, and demonstrates how the four-probe method can be used to measure it.

This guide gives an overview of how to use the Ossila Four-Point Probe System, as well as some general tips and tricks for measuring sheet resistance.

The required characterization methods depend on the type of semiconductor, its intended application, the development stage of the technology and the available deposition techniques.

Minimizing electrical resistance is a key consideration when selecting components for use in probe stations. Lower resistance allows current to flow more easily through the probes to the measurement device, without affecting the measurement itself.

This guide gives an overview of how to use the Ossila Micromanipulators with the Source Measure Unit, as well as some general tips and tricks for getting the most out of sensitive electrical probing measurements.

Learn how to conduct various SMU measurements such as solar cell I-V curves, external voltage tracking, and basic quick measurements.

An I-V curve (short for 'current-voltage characteristic curve'), is a graphical representation of the relationship between the voltage applied across an electrical device and the current flowing through it.

This guide gives you an overview of what to consider when characterising an OLED, as well as tips for their measurement.

Learn how to perform cyclic voltammetry on a polymer with the Ossila Potentiostat.

Cyclic voltammetry is a powerful and versatile electrochemical technique. With modern potentiostats and software packages, the method is relatively straight-forward to perform. Despite this apparent simplicity, there are still a number of things that can go wrong, particularly when setting up the electrochemical cell.