Manual Probe Station
Electrical Characterization, Lab Equipment, Probe Station
Reliable Probing, Every Time
A high performance, professional setup for your lab at a fair price
Overview | Specifications | Features | Gallery | Related Products | Resources and Support
Get clean, reliable data without the high price or complexity of overengineered systems. Designed for small-scale electronics experiments, this probe station opens up simple and stable manual probing to facilitate the experiments you want.
The vacuum-compatible chuck securely holds samples from 5 mm to 150 mm. Complete with integrated vibrational dampening, electrical isolation, 60 fps USB camera, and display screen, this probe station has everything you need to get up and running.
The rest is up to you. It’s compact design makes this system perfect for simple measurements (I-V, C-V measurements or testing individual devices/components) but you can easily adapt it to suit your experiments. It accommodates up to eight micromanipulators, and with a standard optical breadboard base, you can attach additional components and customize the set up for more specific experiments.
Affordable
and Effective
Essential probing without
the premium price
Easily Adaptable
System
Optical breadboard base and spacious magnetic platens
Prioritize
Ergonomics
Intelligent design for
a simple workflow
Complete and
Integrated System
A professional setup
for your lab
Specifications
Base Station & Platens
| Base | Aluminum optical breadboard, 25 mm hole spacing |
|---|---|
| Vibration Isolation | Elastomeric vibration dampening mounts |
| Natural Frequency | 12 Hz |
| Effective Vibration Isolation | >17 Hz |
| Maximum Supported Load | 880 N total |
| Platen Material | Ferromagnetic stainless steel |
| Platen Height | 150 mm |
| Platen Capacity | Up to 8 Ossila Micromanipulators |
Chuck Stage
| Stage Travel | 25 mm (X, Y), 10 mm (Z), 360° (coarse rotation), 15° (fine rotation) |
|---|---|
| Stage Resolution | 0.01 mm (X, Y, Z), 0.1° (rotation) |
| Minimum Substrate Size | 5 mm diameter |
| Maximum Substrate Size | 150 mm diameter |
| Chuck Diameter | 155 mm |
| Chuck Material | Aluminum |
| Chuck Type | Vacuum (selectable zones) |
| Chuck Isolation | >99 MΩ at 500 VDC |
| Chuck Leakage Current | <75 pA at ± 75 VDC |
| Vacuum Connection | Ø=6mm Push-In Tube, Female port |
Microscope
| Microscope Type | Monocular Zoom Lens (0.6x – 5.0x optical zoom) |
|---|---|
| Field of View | 9.3 mm – 1.1 mm |
| Working Distance | 86 mm |
| Camera Sensor | Sony IMX415 (4K, 1/2.8") |
| Maximum Resolution | 4.4 µm line spacing (228 lp/mm) |
| Live Output | USB 3.0 & HDMI (up to 60 fps at full resolution) |
| Camera Software Compatibility | UVC-compliant for plug-and-play viewing with Ossila software and most 3rd party software |
| Monitor | 15.6" 1080p, on a positionable arm |
| Total Magnification | 37x – 309x |
| Illumination | Adjustable LED (coaxial configuration) |
Micromanipulators
Motion
| Drive Axes | X, Y, Z |
|---|---|
| Drive Fine Movement | Micrometer |
| Maximum Axis Travel | 10 mm |
| Graduated Axis Travel | 6.5 mm |
| Micrometer Readout Resolution | 10 μm |
| Micrometer Head Thread Pitch |
50 threads per inch |
| Smallest Achievable Motion | Approx. 4-8 μm |
Probe
| Probe Type | Tungsten, 20 μm tip diameter |
|---|---|
| Probe Connection | SMA |
| Probe Leakage Current | <100 pA at ± 75 VDC |
| Probe Path Resistance | ≤0.3 Ω |
Manual Probe Station Features
Fair Price, Fully Capable
Access essential probing capabilities without destroying your research budget. Purposefully designed to eliminate the limitations of DIY setups and provide a professional alternative to costly commercial systems. The probe station is a practical, value-driven solution that supports rigorous experimentation in your research.
Confidence in Your Measurements
A probe station is only as good as the data it produces. With the Ossila Manual Probe Station, achieve consistent, high-quality data in a low-noise, stable measurement environment. The precision-engineered chuck, vibration isolation, and electrical grounding directly support the reliability and repeatability your research depends on.
Practical and Intelligent Design
Focus on your research and eliminate awkward movements, even during long experiments. Essential stage controls and a swing-away microscope mount provide unobstructed access to the stage for easy setup, precise probing, and fast sample changes. The 60 fps camera allows easy positioning with minimal lag.
Flexible R&D Characterization
From material development to device-level testing, the Ossila Manual Probe Station supports flexible experimentation. Perform a range of DC and low-frequency electrical measurements—from I-V and C-V curves to detailed sensor and optoelectronic analysis—or easily adapt the system for more complex and specific measurements.
Manual Probe Station Gallery
Related Products
Resources
What Features Do You Need in a Probe Station?
Probe stations are incredibly useful for a wide range of experiments from semiconductor characterization to electrophysiology experiments. However, each experiment will have different requirements and every lab has its own demands. The question stands: what is the right probe station set up for you?
Read more...