Probe Station
Lab Equipment, Probe Station
The Ossila Probe Station — Coming Autumn 2025!
Fairly priced and fully capable for reliable probing, every time
Overview | Specifications | Features | Gallery | Related Products
Get clean, reliable data without the high price or complexity of overengineered systems. Designed for small-scale electronics experiments, the Ossila Probe Station opens up simple and stable manual probing to facilitate the experiments you want.
The vacuum-compatible chuck securely holds samples from 5 mm to 150 mm. Complete with integrated vibrational dampening, electrical isolation, 60 fps USB camera and display screen, this probe station has everything you need to get up and running.
The rest is up to you. It’s compact design makes this system perfect for simple measurements (I-V, C-V measurements or testing individual devices/components) but you can easily adapt it to suit your experiments. It accommodates up to eight micromanipulators, and with a standard optical breadboard base, you can attach additional components and customize the set up for more specific experiments.
Affordable
and Effective
Essential probing without
the premium price
Easily Adaptable
System
Optical breadboard base and spacious magnetic platens
Prioritize
Ergonomics
Intelligent design for
a simple workflow
Complete and
Integrated System
A professional setup
for your lab
Specifications*
Base Station & Platens
| Base | Aluminum optical breadboard, 25 mm hole spacing |
|---|---|
| Vibration Isolation | Elastomeric vibration dampening mounts |
| Platen Material | Magnetic stainless steel |
| Platen Height | 150 mm |
| Platen Capacity | Up to 8 Ossila Micromanipulators |
Chuck Stage
| Stage Travel | 25 mm (X, Y), 10 mm (Z), 360° (coarse rotation), 10° (fine rotation) |
|---|---|
| Stage Resolution | 0.01 mm (X, Y, Z), 0.1° (rotation) |
| Maximum Substrate Size | 150 mm diameter |
| Chuck Diameter | 150 mm |
| Chuck Material | Aluminum |
| Chuck Type | Vacuum (selectable zones) |
| Chuck Electrical Properties | Electrically isolated from stage (value TBC), dedicated connection for grounding |
Microscope
| Microscope Type | Monocular Zoom Lens (0.6x – 5.0x optical zoom) |
|---|---|
| Field of View | 9.3 mm – 1.1 mm |
| Working Distance | 86 mm |
| Camera Sensor | Sony IMX415 (4K, 1/2.8") |
| Maximum Resolution | 4.4 µm line spacing (228 lp/mm) |
| Live Output | USB 3.0 & HDMI (up to 60 fps at full resolution) |
| Camera Software Compliance | UVC-compliant for plug-and-play viewing with most 3rd party software |
| Monitor | 15.6" 1080p, on a positionable arm |
| Total Magnification | 37x – 309x |
| Illumination | Adjustable LED (coaxial configuration) |
*The Ossila Probe Station is currently under active development. Some features and specifications are subject to refinement as we approach our Autumn 2025 launch.
Micromanipulators
Motion
| Drive Axes | X, Y, Z |
|---|---|
| Drive Fine Movement | Micrometer |
| Maximum Axis Travel | 10 mm |
| Graded Axis Travel | 6.5 mm |
| Axis Resolution | 10 μm |
| Arm Coarse Movement | Thumbscrew, M4 |
Probe
| Probe Type | Tungsten, 20 μm tip diameter |
|---|---|
| Probe Connection | SMA |
| Probe Leakage Current | <100 pA at ± 75 VDC |
| Probe Path Resistance | ≤0.3 Ω |
Probe Station Features
Fair Price, Fully Capable
Access essential probing capabilities without destroying your research budget. Purposefully designed to eliminate the limitations of DIY setups and provide a professional alternative to costly commercial systems. The probe station is a practical, value-driven solution that supports rigorous experimentation in your research.
Confidence in Your Measurements
A probe station is only as good as the data it produces. With the Ossila Probe Station, achieve consistent, high-quality data in a low-noise, stable measurement environment. The precision-engineered chuck, vibration isolation, and electrical grounding directly support the reliability and repeatability your research depends on.
Practical and Intelligent Design
Focus on your research and eliminate awkward movements, even during long experiments. Essential stage controls and a swing-away microscope mount provide unobstructed access to the stage for easy setup, precise probing, and fast sample changes. 60 fps camera allows easy positioning with minimal lag
Flexible R&D Characterization
From material development to device-level testing, the Ossila Probe Station supports flexible experimentation. Perform a range of DC and low-frequency electrical measurements—from I-V and C-V curves to detailed sensor and optoelectronic analysis— or easily adapt the system for more complex and specific measurements.
Probe Station Gallery
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