Probe Station

Order Code: E451
Manual

Price

(excluding Taxes)

£1,950.00


A multi-purpose probe station, to simplify and speed up measurement. By using interchangeable probes, pre-aligned for a variety of substrate architectures, it becomes quicker and easier to measure:

  • OFET & TFT mobility,
  • Chremiresistor & chemiFET sensors,
  • Sheet resistance and four point probe characterisation,
  • Graphene and 2D characterisation (IV curves and field effect measurements).

The use of gold-coated spring-loaded connectors provides a revolution in contact ease by ensuring robust electro-mechanical connections while massively reducing substrate damage often caused by conventional probes

manual iconView our manual

 

Datasheet

OFET probe station: probe details
Probe station: high density probe head

 

Overview

Designed for organic electronics We've re-designed the probe station for the world of organic electronics where delicate coatings require low-force, reliable contacts.

Ideal for high precision low-current measurement The double ground plane helps to isolate the board from external noise and the intelligent design of the boards wire tracks reduces noise, leakage current and stray capacitance.

Great substrate contact The gold-coated spring-loaded probes provide a constant pressure to the substrate reducing or eliminating the 'destructive testing' often caused by the electro-mechanical contacts from standard probes.

Easy alignment By pre-aligning the probes and substrate we significantly reduce the time and difficulty of aligning the system. Our current range of interchangeable probes works for our low density and high density OFET system. We also offer a four point probe for conductivity and custom probes are also available for most applications.

Precision Alignment The use of high quality optomechanical components with 1 µm readability micrometers (10 µm repeatability) allows accurate positioning of the probes.

Small form factor Small is beautiful as they say and we've designed our probe station to be as compact and easy to use as possible. It's specifically designed for transfer into glove boxes through the small anti chamber, where movement and dexterity are impaired.

Standard connectors The use of standardised BNC connectors makes it easy to connect to a wide range of test equipment and minimises the cost and complexity of inter-series adapters.

  

Download the manual and our measurement guide here

 

Specifications

General

Dimensions 175 x 125 x 105 mm (L x W x H)
Weight 1.9 kg
X & Y travel 13 mm
Z travel 13 mm

 

High Density OFET probe head

Configuration Pre-aligned source-drain probes with easy back-gate contact
Connections Twin BNC connectors for gate and drain with combined earth for source
Probe coating 20 µm Gold coated nickel
Probe tip diameter 1.07 mm
Contact force 60 g
Tip spacing 2.54 mm

 

High density two point probe technical drawing

 

High density two-point probe head

 

Low Density OFET probe head

Configuration Pre-aligned source-drain probes with easy back-gate contact
Probe coating 20 µm Gold coated nickel
Probe tip diameter 1.07 mm
Contact force 60 g
Tip spacing 18 mm
Low density probe: technical illustration

 

Probe station: low density two-point probe head

 

Four-point probe head

Configuration Four probes in line with exterior pair for current drive and interior pair for voltage measurement
Probe coating 20 µm Gold coated nickel
Probe tip diameter 1.07 mm
Contact force 60 g
Tip spacing 1.27 mm

 

Four-point probe: technical illustration

 

Probe station: four-point probe head

 

To the best of our knowledge the technical information provided here is accurate. However, Ossila assume no liability for the accuracy of this information. The values provided here are typical at the time of manufacture and may vary over time and from batch to batch.