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Product Code T2009A1-T2007A1-P
Expected price from $8,250

The Ossila Probe Station — Coming Autumn 2025!

Fairly priced and fully capable for reliable probing, every time


Overview | Specifications | Features | Gallery | Related Products


Get clean, reliable data without the high price or complexity of overengineered systems. Designed for small-scale electronics experiments, the Ossila Probe Station opens up simple and stable manual probing to facilitate the experiments you want.

The vacuum-compatible chuck securely holds samples from 5 mm to 150 mm. Complete with integrated vibrational dampening, electrical isolation, 60 fps USB camera and display screen, this probe station has everything you need to get up and running.

The rest is up to you. It’s compact design makes this system perfect for simple measurements (I-V, C-V measurements or testing individual devices/components) but you can easily adapt it to suit your experiments. It accommodates up to eight micromanipulators, and with a standard optical breadboard base, you can attach additional components and customize the set up for more specific experiments.

Fairly priced to fit your budget

Affordable
and Effective

Essential probing without
the premium price

A probe station built for high-quality data

Easily Adaptable
System

Optical breadboard base and spacious magnetic platens

Designed for your science

Prioritize
Ergonomics

Intelligent design for
a simple workflow

A practical alternative to a DIY setup

Complete and
Integrated System

A professional setup
for your lab

Contact Ossila

Contact us to learn more about how the Ossila Probe Station can enhance your experiments, stay informed about upcoming product developments, or register your early interest.

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Specifications*


Base Station & Platens

Base Aluminum optical breadboard, 25 mm hole spacing
Vibration Isolation Elastomeric vibration dampening mounts
Platen Material Magnetic stainless steel
Platen Height 150 mm
Platen Capacity Up to 8 Ossila Micromanipulators

Chuck Stage

Stage Travel 25 mm (X, Y), 10 mm (Z), 360° (coarse rotation), 10° (fine rotation)
Stage Resolution 0.01 mm (X, Y, Z), 0.1° (rotation)
Maximum Substrate Size 150 mm diameter
Chuck Diameter 150 mm
Chuck Material Aluminum
Chuck Type Vacuum (selectable zones)
Chuck Electrical Properties Electrically isolated from stage (value TBC), dedicated connection for grounding

Microscope

Microscope Type Monocular Zoom Lens (0.6x – 5.0x optical zoom)
Field of View 9.3 mm – 1.1 mm
Working Distance 86 mm
Camera Sensor Sony IMX415 (4K, 1/2.8")
Maximum Resolution 4.4 µm line spacing (228 lp/mm)
Live Output USB 3.0 & HDMI (up to 60 fps at full resolution)
Camera Software Compliance UVC-compliant for plug-and-play viewing with most 3rd party software
Monitor 15.6" 1080p, on a positionable arm
Total Magnification 37x – 309x
Illumination Adjustable LED (coaxial configuration)

*The Ossila Probe Station is currently under active development. Some features and specifications are subject to refinement as we approach our Autumn 2025 launch.

Micromanipulators

Motion

Drive Axes X, Y, Z
Drive Fine Movement Micrometer
Maximum Axis Travel 10 mm
Graded Axis Travel 6.5 mm
Axis Resolution 10 μm
Arm Coarse Movement Thumbscrew, M4

Probe

Probe Type Tungsten, 20 μm tip diameter
Probe Connection SMA
Probe Leakage Current <100 pA at ± 75 VDC
Probe Path Resistance ≤0.3 Ω

Probe Station Features


Low-cost, high-value alternative to costly systems

Fair Price, Fully Capable

Access essential probing capabilities without destroying your research budget. Purposefully designed to eliminate the limitations of DIY setups and provide a professional alternative to costly commercial systems. The probe station is a practical, value-driven solution that supports rigorous experimentation in your research.

For reliable and repeatable research

Confidence in Your Measurements

A probe station is only as good as the data it produces. With the Ossila Probe Station, achieve consistent, high-quality data in a low-noise, stable measurement environment. The precision-engineered chuck, vibration isolation, and electrical grounding directly support the reliability and repeatability your research depends on.

Real-world ergonomics

Practical and Intelligent Design

Focus on your research and eliminate awkward movements, even during long experiments. Essential stage controls and a swing-away microscope mount provide unobstructed access to the stage for easy setup, precise probing, and fast sample changes. 60 fps camera allows easy positioning with minimal lag

Flexible electrical characterization

Flexible R&D Characterization

From material development to device-level testing, the Ossila Probe Station supports flexible experimentation. Perform a range of DC and low-frequency electrical measurements—from I-V and C-V curves to detailed sensor and optoelectronic analysis— or easily adapt the system for more complex and specific measurements.


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