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Product Code T2001A4
Price £2,000 ex. VAT

Quick and Accurate Characterization for a Wide Range of Materials

Experience effortless sheet resistance measurements with easy-to-use PC software

Overview | Specifications | Features | Gallery | Software | In the Box | Accessories | Resources and Support

The Ossila Four-Point Probe is an easy-to-use tool for the rapid measurement of sheet resistance, resistivity, and conductivity of materials. Built with a high-specification Ossila Source Measure Unit at its core, the low cost system has a wide measurement range.

Our four-point probe reduces the risk of damaging your delicate samples, such as polymer films with thicknesses on the order of nanometres. The probe head uses rounded, spring-loaded contacts instead of sharp needles for good electrical contact without piercing the sample.

We have curated a compact and durable design for use in busy labs where shelf space is limited. Choose the Ossila Four-Point Probe to elevate your materials characterization and thin film development programs.

Two-Year Warranty

Two-Year Warranty

Buy with confidence

Free four-point probe software

Free Software

Keeping your software up to date

Wide current range

Wide Current Range

Characterization of a wide range of materials

Easy to use

Easy to Use

A simple and intuitive interface


Voltage Range ±100 μV to ±10 V
Current Range ±1 μA to ±200 mA (5 ranges)
Sheet Resistance Range 100 mΩ/□ to 10 MΩ/□ (ohms per square)
Sheet Resistance Accuracy* Precision** Measured at Range
100 mΩ/□ ±8% ±3% 200 mA
1 Ω/□ ±2% ±0.5% 200 mA
10 Ω/□ ±1% ±0.5% 200 mA
100 Ω/□ ±1% ±0.05% 20 mA
1 kΩ/□ ±1% ±0.03% 20 mA
10 kΩ/□ ±1% ±0.02% 2000 µA
100 kΩ/□ ±2% ±0.05% 200 µA
1 MΩ/□ ±8% ±0.5% 20 µA
10 MΩ/□ ±30% ±5% 20 µA

* Accuracy is the maximum deviation from the true value.

** Precision is the maximum deviation between identical measurements (useful for comparative measurements).

Four-Point Probe Features

Non-destructive soft contact probes

Non-Destructive Soft Contact Probes

Designed to measure delicate samples. Rounded, soft contact probes, with a 0.24 mm radius, spread the downward force applied to the sample. The probes are gold plated and mounted on springs for good electrical contact. When making contact, they retract into the head to ensure that a uniform force of 60 grams is applied.

Wide current range

Wide Current Range

Our four-point probe is capable of delivering currents between 1 μA and 200 mA, and can measure voltages from as low as 100 μV up to 10 V. The system can measure sheet resistances in the range of 100 mΩ/□ to 10 MΩ/□, enabling the characterization of a wide range of materials.

High accuracy four-point probe

High Accuracy

Positive and negative polarity measurements can be performed to calculate the average sheet resistance between positive and negative currents. This eliminates any voltage offsets that may have occurred, hence increasing the accuracy of your measurements.

Linear translation stage with height control

Linear Translation Stage

With micrometer height control for simple and controlled soft sample contact. The manual knob makes it easy to achieve good electrical contact each time. Plus, the non-slip stage keeps your samples steady and ensures your delicate samples are not damaged by movement during characterization.

Large sample stage for accurate measurements

Characterize Large Samples

The large stage area means you can characterize larger samples up to a 6 inch diameter (152.4 mm). Larger samples are less reliant on correction factors and provide more accurate measurements when characterizing your materials.

Soft contact probes
Micrometer height control
Large sample stage
Lab proof build
Extended probe head


Control your four-point probe with our free, user-friendly Ossila Sheet Resistance Lite software. The software can calculate appropriate geometrical correction factors for the sample geometry and the resistivity and conductivity of the sample to allow for extensive, accurate electrical characterization of materials.

Sheet Resistance Lite Software
Sheet Resistance Lite Measurement Software

In the Box

  • Ossila Four-Point Probe with head and stage
  • Integrated source measure unit
  • 60 x 60 mm glass substrate coated with 400 – 450 nm of FTO
  • Power adapter (24 VDC)
  • USB-B cable

Accessories and Related Products

Resources and Support

How to Measure Sheet Resistance using a Four-Point Probe

The most common technique used for measuring sheet resistance (surface resistance) is the four-probe method. This technique involves using four equally spaced, co-linear probes to make electrical contact with the material. Most four-point probes available commercially use sharp needles as probes.

Learn more...
Calculate Sheet Resistance Using the Four-Probe Method Calculate Sheet Resistance Using the Four-Probe Method

This guide explains the theory behind sheet resistance, an electrical property of thin films of materials, and demonstrates how the four-probe method can be used to measure it.

Making OLED and OPV solar cells: Quickstart Guide Making OLED and OPV solar cells: Quickstart Guide

Organic photovoltaic cells (OPVs) or organic light emitting diodes (OLEDs) can be easily manufactured using Ossila’s pre-patterned ITO substrates and a few simple spin coating and evaporating steps.

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