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Ossila Sheet Resistance Lite 1.0.6
Sheet resistance measurement software for the Ossila Four-Point Probe System.
Download (76.4 MB)
Minimum System Requirements
Operating System Windows 10 or 11 (64-bit)
CPU Dual Core 2 GHz
RAM 2 GB
Available Drive Space 262.5 MB
Monitor Resolution 1440 x 900
Connectivity USB 2.0, Ethernet (requires DHCP)
Quick and accurate characterisation for a wide range of materials
Experience effortless sheet resistance measurements with the system's easy-to-use PC software
Part of the Institute of Physics award-winning Ossila Solar Cell Prototyping Platform, the Ossila Four-Point Probe System is an easy-to-use tool for the rapid measurement of sheet resistance, resistivity, and conductivity of materials.
Built with a high-specification Ossila Source Measure Unit at its core, the Ossila Four-Point Probe is a low-cost system that allows a wide measurement range. The probe head uses spring-loaded contacts instead of sharp needles, preventing damage to delicate samples, such as polymer films with thicknesses on the order of nanometres. The price includes a four-point probe, in-built source measure unit, easy-to-use PC software, and an ITO-coated glass substrate. With free tracked worldwide shipping as standard, more laboratories across the globe can now measure sheet resistance to empower their materials characterisation and thin-film development programs.
The Ossila Four-Point Probe is now supplied with a global power cord that supports all major plug types (type G, type F, type A and type I). Please contact us for more information.
Covered by the Ossila Warranty
Keeping your software up to date
Characterisation of a wide range of materials
Easy to Use
A simple and intuitive interface
Wide Current Range
The four-point probe is capable of delivering currents between 1 μA and 200 mA, and can measure voltages from as low as 100 μV up to 10 V. The system can measure sheet resistances in the range of 100 mΩ/□ to 10 MΩ/□, enabling the characterisation of a wide range of materials.
Just plug in the system, install the software, and you're ready to go! The intuitive interface and clean design makes the four-point probe easy-to-use, simplifying the measurement of sheet resistance. Substrates of various shapes and sizes can be used.
Positive and negative polarity measurements can be performed using the PC software. This enables you to calculate the average sheet resistance between positive and negative currents — eliminating any voltage offsets that may have occurred, hence increasing the accuracy of your measurements.
Designed with the measurement of delicate samples in mind, the four-point probe head utilises gold-plated, gentle spring-loaded contacts with rounded tips. This results in a constant contact force of 60 grams, preventing the probes from piercing fragile thin films, whilst still providing good electrical contact.
Through careful design consideration, we have been able to keep the footprint of the four-point probe to a minimum (total bench area of 14.5 cm x 24 cm), allowing it to be used even in busy labs where shelf space is limited.
Rapid Material Characterisation
The PC software (included with the system) performs all the necessary measurements and calculations for sheet resistance, resistivity, and conductivity — making material characterisation effortless. It also automatically performs correction factor calculation.
Equipped with Soft Contact Probes
The Ossila Four-Point Probe System reduces the potential of damaging delicate thin films via three features. The probes, used to make contact, have rounded tips (unlike other probes which are like sharp needles). These rounded tips have a radius of 0.24 mm and give the probes a larger contact surface area than a needle would, therefore spreading out the downward force being applied to the sample. These probes are gold plated and mounted on springs to encourage electrical contact without excessive force as it enables them to retract into the probe head when making contact with the sample to ensure that a uniform force of 60 grams is applied. A schematic of the probes is shown in the figure below. The probe head can be purchased separately here.
Please note, this system is not suitable for silicon or other materials which naturally form insulating oxide layers. To measure such materials, the oxide layer needs to be penetrated by the probes, which may not be possible with the spring-loaded, round tipped probes utilised by this system.
Included with the Ossila Four-Point Probe
The Four-Point Probe Unit
Built-in Ossila Source Measure Unit
The Ossila Four-Point Probe is powered by our Source Measure Unit. Supplied with a 24 V / 2 A power adapter and USB-B cable.
For more information, please refer to the Source Measure Unit product page.
Four-point probe head
Providing a constant contact force of 60 grams, the spring-loaded four point probe head is perfect for delicate samples. The probes are gold-plated to ensure good electrical contact is made without excess force, and are rounded to further prevent them from causing damage to thin films and other fragile samples (note that they are not suitable for silicon or other materials with insulating oxide layers).
Linear translation stage
With micrometer height control and a sample stage with non-slip rubber.
Software and Accessories
Ossila Four-Point Probe Software
The Ossila Sheet Resistance Lite software is quick, simple and easy to use. Accurate results are assured by the automatic geometrical correction factors, and the software is able to calcuate the resistivity and conductivity of the sample on the fly for quick characterisation of materials.
The software is supplied on the included USB memory stick along with a copy of the user manual and QC data. In addition, the latest version is always available to download for free from our website.
ITO-coated glass substrate
100 nm ITO coated glass substrate (20 x 15 mm).
Also available seperately. Please refer to the ITO-coated glass substrate product page for more information.
Resources and Support
Four-Point Probe Measurement Specifications
|±100 μV to ±10 V
|±1 μA to ±200 mA (5 ranges)
|Sheet Resistance Range
|100 mΩ/□ to 10 MΩ/□ (ohms per square)
|Measured at Range
*Accuracy is the maximum deviation from the true value.
** Precision is the maximum deviation between identical measurements (useful for comparative measurements).
Physical Device Specifications
|1.27 mm (0.05")
|Rectangular Sample Size Range
Long Edge Minimum: 5 mm (0.20")
Short Edge Maximum: 60 mm (2.36")
|Circular Sample Size Range (Diameter)
|5 mm to 76.2 mm (0.20" x 3.00")
|Maximum Sample Thickness
|10 mm (0.39")
|Overall Dimensions (W x H x D)
|145 mm x 150 mm x 240 mm (5.71" x 5.91" x 9.45")
Resistivity and Conductivity Range
As the system measures the sheet resistance of a sample, a general range of measurable resistivities or conductivities cannot be given. This is because the measurable resistivity range depends on the thickness of the sample being tested. The resistivity of a sample can be calculated from its sheet resistance and thickness using the following equation:
The system is capable of measuring between 100 mΩ/□ and 10 MΩ/□, so if we use these values in the formula above with a sample 50 nm thick, then the resistivity (conductivity) range that can be measured by the system will be 5 nΩ.m to 500 mΩ.m (2 S/m to 200 MS/m). If the sample is 400 µm thick, then the resistivity (conductivity) range of the system is 40 µΩ.m to 4 kΩ.m (250 µS/m to 25 kS/m). Below is a table of the resistivity and conductivity ranges of the system for samples with thicknesses of different orders of magnitude:
|1 nΩ.m – 100 mΩ.m
|10 S/m – 1 GS/m
|10 nΩ.m – 1 Ω.m
|1 S/m – 100 MS/m
|100 nΩ.m – 10 Ω.m
|100 mS/m – 10 MS/m
|1 µΩ.m – 100 Ω.m
|10 mS/m – 1 MS/m
|10 µΩ.m – 1 kΩ.m
|1 mS/m – 100 kS/m
|100 µΩ.m – 10 kΩ.m
|100 µS/m – 10 kS/m
An intuitive and user-friendly standalone PC program is used to control the four-point probe measurement, enabling rapid characterisation of materials without the need for the user to write any code themselves. This PC software calculates appropriate geometrical correction factors for the given sample geometry, ensuring accurate results. It can also calculate the resistivity and conductivity of the sample, if the thickness is provided, to allow for extensive electrical characterisation of materials.
The software saves data to comma-separated value (.csv) files, facilitating importing the data into your preferred analysis software. Advanced settings give you greater control over the measurment, allowing you to set voltage and current limits, perform negative polarity measurements, or use probes with different spacings.
Key Software Features
- Clean and intuitively-designed interface
- Data saved to .csv file
- Calculates resistivity and conductivity for samples with a known thickness
- Automatic correction factor calculation
|Windows 10 (32-bit or 64-bit)
|Dual Core 2 GHz
|Available Hard Drive Space
|1440 x 900
|USB 2.0, or Ethernet (requires DHCP)
The Ossila Four-Point Probe comes with everything you need, including a power adapter, a USB-B cable, a 400 – 450 nm FTO coated glass substrate (60 mm x 60 mm x 2.2 mm), a 10 kΩ resistor test head, and a USB memory stick pre-loaded with the user manual, software installer, QC data, and USB drivers. Spare probe heads can be bought seperately.
Four-Point Probe Spares and Accessories
Related Processing Equipment
To the best of our knowledge the information provided here is accurate. The values provided are typical at the time of manufacture and may vary over time and from batch to batch. Products may have minor cosmetic differences (e.g. to the branding) compared to the photos on our website. All products are for laboratory and research and development use only.