Micromanipulator
Electrical Characterization, Lab Equipment, Motion Control, Probe Station
Manual Micromanipulator for Precise Micron-Scale Positioning
Save on a pair for intuitive positioning control in advanced applications
Overview | Specifications | Features | Gallery | In the Box | Related Products | Resources and Support
Implement ultra-accurate, high-precision probing in your small-scale electronics experiments with the Ossila Micromanipulator, featuring 6.5 mm graduated travel on all three axes. Precision linear bearings deliver micron-level accuracy and repeatable positioning with a choice of 10 μm or 5 μm resolution, and minimal backlash or drift.
Control the probe without looking away from your microscope with micrometer heads aligned to each axis of motion. With the magnetic base, narrow probe shank and long, compact arm, you can use multiple micromanipulators simultaneously in tight spaces.
For semiconductor devices, we recommend the Ossila Source Measure Unit to complete your electrical characterization setup.
Micron-Level Precision
Achieve accurate, repeatable probe positioning
Ergonomic Control
Easily adjust positioning without looking
Low Leakage Current
For your sensitive semiconductor measurements
Save on a Pair
Choose left-handed, right-handed, or both
Key Specifications
Motion
| Compact Micrometer | High Precision Micrometer | |
|---|---|---|
| Drive Axes | X, Y, Z | X, Y, Z |
| Drive Fine Movement | Micrometer | Fine-pitch micrometer |
| Maximum Axis Travel | 10 mm | 10 mm |
| Graduated Axis Travel | 6.5 mm | 6.5 mm |
| Micrometer Readout Resolution | 10 μm | 5 µm |
| Micrometer Head Thread Pitch | 50 threads per inch | 100 threads per inch |
| Smallest Achievable Motion | Approx. 4-8 µm | Approx. 2-4 µm |
Probe
| Probe Type | Tungsten, 20 μm tip diameter |
|---|---|
| Probe Connection | SMA |
| Probe Leakage Current | <100 pA at ± 75 VDC |
| Probe Path Resistance | ≤0.3 Ω |
Micromanipulator Features
Precise and Reliable Positioning
Confidently control manual probing in your experiments with smooth, repeatable movement on every axis. A precision linear bearing with spring-loading eliminates backlash while high-quality micrometers achieve positioning resolution as low as 2 μm along a 10 mm travel distance.
DC Current Probing
Designed to support your most sensitive electrical tests, the low leakage current and path resistance is ideal for DC measurements on semiconductor devices. The SMA connector makes setup quick, while the secured coaxial cable prevents vibration and electronic noise from disrupting your results.
Adapt to Your Experiments
Ideal for labs that demand versatility, take advantage of excellent positioning accuracy in other applications. Swap the DC probe for a wide range of probes, syringes, micropipettes, vacuum needles, optical fibers, and more.
Comfortable and Intuitive Control
Stay focused on your microscope. The micrometer controls are aligned with each axis making blind control easy and intuitive. Plus, our micromanipulators pair easily with the Ossila Probe Station to complete your probing setup.
Micromanipulator Gallery
Additional Specifications
| Base Type | Permanent Magnet |
|---|---|
| Body Material | Anodized Aluminum |
| Dimensions (L x W x H) | 155 mm x 74 mm x 78 mm (6.10" x 2.91" x 3.07") |
| Extended Dimensions (L x W x H) | 231 mm x 77 mm x 84 mm (9.09" x 3.03" x 3.31") |
| Weight | 400 g |
In the Box
- Micromanipulator (single or pair)
- 20 μm tungsten probe tip
- 1 m SMA to SMA coaxial cable
- Documentation
Related Products
Resources and Support
Connecting the Micromanipulator to the Source Measure Unit
Learn how to use your micromanipulator with the Ossila Source Measure Unit. Plus, pick up some general tips and tricks for getting the most out of sensitive electrical probing measurements.
Read more...