The Ossila OLED lifetime system is designed to provide a long-term and low-cost solution to OLED lifetime testing. Lifetime testing is a necessary tool for optimising the stability of your OLED devices and minimising degredation over time.
Combining a source-measure unit with specially designed test boards and intuitive software provides a robust and user-friendly OLED lifetime testing system. Compatibility with both the 8-pixel and 6-pixel Ossila substrate systems enables the user to easily fabricate and test OLED devices.
System Overview
The main components of the OLED lifetime system are a source measure unit, an Ossila test board (either manual or multiplexing) and a specially designed photodiode lid. These are controlled via the OLED Lifetime software, which makes your measurements easier and less time consuming.
The following video shows how the OLED Lifetime system works:
The multiplexing test board controls a series of automated switches which can cycle through pixels without user intervention.The elecrical components are stacked vertically, reducing system the footprint and reducing wasted lab space. This small form factor also allows placement of the lifetime tester in previously inconvenient places such as a glovebox.
Devices are secured within the test board beneath a photodiode lid. The system takes advantage of the two built int source measure units (SMUs) to characterise the device. One SMU performs JV operations via the test board, while the other SMU measures photodiode current. The test board and photodiode are connected to the source measure units via BNC cables.
| Component List |
| Source Measure Unit |
| Multiplexing Board Test Board / 6 pixel Push Fit Test Board / 8 Pixel Push Fit Test Board |
| Photodiode lid with Centronic OSD50-E Eye Response photodiode. |
| BNC Cable x 2 |
| Spacer legs and fittings |
| OLED Lifetime System Software + User Guide |
An intuitive and highly customisable OLED Lifetime software suite performs JV, JVL and lifetime measurements.
The user can perform an initial JV/JVL sweep to determine the operating current of the LED and photodiode. This data is then used to select an LED or photodiode current at which to start the lifetime measurements. Voltage is automatically adjusted to keep the LED current constant over the desired measurement time.
Both the JVL and lifetime data can be output to a .csv file for easy documentation.
Please see the OLED Lifetime System software guide for more information.
Features
| System Type | Manual | Multiplexer |
| ±10 V Source Range | ||
| ±333 μV Source Resolution | ||
| ±100 mA Measurement Range | ||
| ±10 nA Measurement Resolution | ||
| Software Included | ||
| IV Curve Measurement | ||
| OLED Lifetime Measurement | ||
| For Use With S101 or S211 Substrates | ||
| Automatic Device Switching | ||
| Multiple Devices Lifetime Measurement |
Specifications
| Voltage Range | ±100 μV to ±10 V |
| Current Range | 10 nm to 100 mA |
| Substrate Size | 20 mm x 15 mm |
| Substrate System Compatibility | S101, S211, S171 |
| Overall Dimensions - Manual (E621 / E641) |
Source Measure Unit:
|
| Overall Dimensions - Multiplexer (E622 / E642) | Width: 140 mm Height: 80 mm Depth: 265 mm |
Software Requirements
| Supported Operating Systems | Windows Vista, 7, and 10 |
| Minimum Monitor Resolution | 1600 x 900 |
| Recommended Monitor Resolution | 1920 x 1080 |
| Required Hard Drive Space | 400 MB |
More Test Systems
To the best of our knowledge the technical information provided here is accurate. However, Ossila assume no liability for the accuracy of this information. The values provided here are typical at the time of manufacture and may vary over time and from batch to batch.