OLED Lifetime System

Order Code: E641
Manual

Price

(excluding Taxes)

£1,395.00


The Ossila OLED lifetime system is designed to provide a long-term and low-cost solution to OLED lifetime testing. Lifetime testing is a necessary tool for optimising the stability of your OLED devices and minimising degredation over time.

Combining a source-measure unit with specially designed test boards and intuitive software provides a robust and user-friendly OLED lifetime testing system. Compatibility with both the 8-pixel and 6-pixel Ossila substrate systems enables the user to easily fabricate and test OLED devices.

 

OLED Lifetime System variants
OLED Lifetime System: multiplexing system (left) and manual system (right).

System Overview

The main components of the OLED lifetime system are a source measure unit, an Ossila test board (either manual or multiplexing) and a specially designed photodiode lid. These are controlled via the OLED Lifetime software, which makes your measurements easier and less time consuming.
The following video shows how the OLED Lifetime system works:

 

The multiplexing test board controls a series of automated switches which can cycle through pixels without user intervention.The elecrical components are stacked vertically, reducing system the footprint and reducing wasted lab space. This small form factor also allows placement of the lifetime tester in previously inconvenient places such as a glovebox.

 

 

OLED Lifetime System Schematic
System Schematic

 

Devices are secured within the test board beneath a photodiode lid. The system takes advantage of the two built int source measure units (SMUs) to characterise the device. One SMU performs JV operations via the test board, while the other SMU measures photodiode current. The test board and photodiode are connected to the source measure units via BNC cables.

 Component List
Source Measure Unit
Multiplexing Board Test Board / 6 pixel Push Fit Test Board / 8 Pixel Push Fit Test Board
Photodiode lid with Centronic OSD50-E Eye Response photodiode.
BNC Cable x 2
Spacer legs and fittings
OLED Lifetime System Software + User Guide

 

OLED and Photodiode Lid
Photodiode Lid.

 

An intuitive and highly customisable OLED Lifetime software suite performs JV, JVL and lifetime measurements.

The user can perform an initial JV/JVL sweep to determine the operating current of the LED and photodiode. This data is then used to select an LED or photodiode current at which to start the lifetime measurements. Voltage is automatically adjusted to keep the LED current constant over the desired measurement time.

Both the JVL and lifetime data can be output to a .csv file for easy documentation.

OLED Lifetime System Software
OLED Lifetime Software Control Panel.

 

Please see the OLED Lifetime System software guide for more information.

Features

System Type Manual Multiplexer
±10 V Source Range
±333 μV Source Resolution
±100 mA Measurement Range
±10 nA Measurement Resolution
Software Included
IV Curve Measurement
OLED Lifetime Measurement
For Use With S101 or S211 Substrates
Automatic Device Switching
Multiple Devices Lifetime Measurement

      Specifications

      Voltage Range ±100 μV to ±10 V
      Current Range 10 nm to 100 mA
      Substrate Size 20 mm x 15 mm
      Substrate System Compatibility S101, S211, S171
      Overall Dimensions - Manual (E621 / E641)

      Source Measure Unit:
      Width: 123 mm
      Height: 40 mm
      Depth: 165 mm


      Test Board:
      Width: 105 mm
      Height: 40 mm
      Depth: 125 mm

      Overall Dimensions - Multiplexer (E622 / E642) Width: 140 mm
      Height: 80 mm
      Depth: 265 mm

      Software Requirements

      Supported Operating Systems Windows Vista, 7, and 10
      Minimum Monitor Resolution 1600 x 900
      Recommended Monitor Resolution 1920 x 1080
      Required Hard Drive Space 400 MB

       


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      To the best of our knowledge the technical information provided here is accurate. However, Ossila assume no liability for the accuracy of this information. The values provided here are typical at the time of manufacture and may vary over time and from batch to batch.


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