Prefabricated OFET Test Chips (Low-Density)


Product Code S181
Not in stock
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We use silicon/silicon oxide substrates with thermally evaporated gold electrodes. Our standard prefabricated substrates are supplied in batches of ten and fabricated using our Low Density OFET system; see schematics below for details.

The prefabricated low-density OFET test chips are recommended for the testing of multiple experimental parameters, such as the choice of semiconductor, concentration and deposition methods and conditions. When you require the collection of statistical data, the high-density OFET test chips are recommended.

The low-density test chips are compatible with Ossila's OFET Test Board for Low-Density OFETs (E222) to make mobility screening quick and simple.

A surface passivation treatment is recommended in order to achieve the best results with these bottom-contact, bottom-gate devices. There is a surface treatment procedure detailed in the User Manual for your convenience.

All devices are made to order, so the lead time is up to 2 weeks for standard devices. We can also fabricate the patterns onto other substrate materials for your individual research requirements, so please contact us to discuss your needs.  

If you are uncertain about which range of specifications best suits your needs, please contact us to speak to one of our technical support team.

 

Product
code
Channel
geometry
Channel
width
Channel
length
OTS/PFBT
treatment*
Quantity Price
S181 Linear 1 mm 30 µm No 10 £499
S183 Linear 1 mm 30, 40, 50, 60, 80 µm No 10 £499
*OTS = octadecyltrichlorosilane / PFBT = pentafluorobenzenethiol

 

Low density bottom gate bottom contact prefabricated FET substrate 
Pre-fabricated low-density FET substrate.

 

Schematics

Constant channel length design

Low density FET substrate mask dimensions (constant channel length)
Constant channel width low-density FET design.

 

Variable channel length design

Low density OFET substrate mask dimensions (variable channel length)
Variable channel width low-density FET design.

 

Produce 5 OFETs in 60 seconds

 

To see the expanded version of this video with further details on device structure and measurement, click here.

 

To the best of our knowledge the technical information provided here is accurate. However, Ossila assume no liability for the accuracy of this information. The values provided here are typical at the time of manufacture and may vary over time and from batch to batch.