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Source-Drain Deposition Mask, Low Density


Product Code E291
Price $390

Produce a total of 60 devices in a single evaporation

ensures conductivity between the metal electrodes and the p-doped silicon


Shadow masks for deposition of source drain contacts. Designed for use in the low density evaporation stack with our standard sized substrates of 20 x 15 mm. Each mask will work with up to 12 substrates, each with five OFETs to produce a total of 60 devices in a single evaporation.

Datasheet


Linear channels of width 1 mm with two designs available of either five identical channel lengths of 30 μm or variable channel lengths of 30, 40, 50, 60 and 80 μm (one per substrate)

Number of OFETs 60 (5 per substrate)
Channel length E291: 30 μm
E292: 30, 40, 50, 60, 80 μm (one each per substrate)
Channel width 1 mm
Contact pad size 1 mm x 1 mm
Mask thickness 35 µm
Channel bar tolerance ±13 µm
Mask material Hard electroformed nickel

*E291/E292 yield of working devices is 90% (54/60).

Schematic of the the whole mask (see source-drain evaporation stack for details of how it fits with other layers).
Schematic of the the whole mask (see source-drain evaporation stack for details of how it fits with other layers).
Optical image of the variable width source-drain evaporation mask.
Optical image of the variable width source-drain evaporation mask.
Optical image of the 30 µm width source-drain evaporation mask
Optical image of the 30 µm width source-drain evaporation mask

The mask is designed in such a way that during the deposition of the gate electrodes on the corner of the substrate the metal should cover the edge of the substrate as well. This ensures conductivity between the metal electrodes and the p-doped silicon. If you find the edges of the substrate not to be conductive you must scratch the edges of the substrate to remove the insulating silicon oxide in correspondence with the corner where the gate electrode will be deposited.

Prefabricated OFET: gate electrode details
Prefabricated OFET: details of the gate pad/doped silicon electrical contact.

B-Grade Masks


Masks with one channel that falls outside of our quality standards are listed as B-Grade. The other 59 channels on these masks are of the same standard as on our A-Grade masks. It is possible that the substandard channel may produce a working device, however this cannot be guaranteed. Therefore, these B-Grade masks are offered at a discounted price.

System Overview


System Overview


The low density fabrication system has four different masks available (source-drain, gate deposition, active area deposition, and insulator deposition) to allow the fabrication of devices in any geometry (top/bottom gates and top/bottom source-drain). The diagrams below show the features on each of the individual masks as well as how they fit together on a substrate.

OFET evaporation stack low density
Schematic diagram showing how the different evaporation masks fit together on a device. For back-gate Si/SiO2 substrates, the insulator and gate masks are not required as the gate contacts on the source-drain mask wrap around to contact the central Si layer of the substrate.
Ossila low density evaporation masks
Left: an FET using the low density evaporation masks. Right: a back-gated FET using Si/SO2 substrates.

Note that silicon oxide substrates do not need a gate mask which simplifies fabrication, however the use of a gate mask with quartz-glass substrates can allow lower operating voltages and lower parasitic capacitance.

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