Four-Point Probe Head
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A four-point probe head for the Ossila Four-Point Probe System that can be used to measure sheet resistance, resistivity, and conductivity.
The probe head features gold-coated probes to provide good electrical contact. These probes are rounded and spring loaded to reduce or eliminate damage to samples that can be caused by sharp probes whilst ensuring a uniform force of 60 grams is applied.
Please note, this probe head is not suitable for silicon or other materials which naturally form insulating oxide layers. To measure such materials, the oxide layer needs to be penetrated by the probes, which may not be possible with the spring-loaded, round tipped probes utilised by this probe head.
Specifications
Probe Spacing | 1.27 mm |
Probe Radius | 0.24 mm |
Probe Stroke | 1.4 mm |
Spring Force | 25 - 60 grams |
Maximum Current | 2 A |
Connections | SMA (P2010A2) BNC (P2010A1) |
Ossila Four-Point Probe Compatibility | P2010A2 - T2001A4 (152.4 mm samples) P2010A1 - T2001A3 (76.2 mm samples) |