Four-Point Probe Head

Electrical Test Boards, Equipment Accessories,

Gold-coated probes to provide good electrical contact

measure sheet resistance, resistivity, and conductivity with ease

A four-point probe head for the Ossila Four-Point Probe that can be used to measure sheet resistance, resistivity, and conductivity.

The probe head features gold-coated probes to provide good electrical contact. These probes are rounded and spring loaded to reduce or eliminate damage to samples that can be caused by sharp probes whilst ensuring a uniform force of 60 grams is applied.

Schematic diagram of the probes of the Four-Point Probe Head.

Please note, this probe head is not suitable for silicon or other materials which naturally form insulating oxide layers. To measure such materials, the oxide layer needs to be penetrated by the probes, which may not be possible with the spring-loaded, round tipped probes utilised by this probe head.

Specifications

Probe Spacing	1.27 mm
Probe Radius	0.24 mm
Probe Stroke	1.4 mm
Spring Force	25 - 60 grams
Maximum Current	2 A
Measurement Error	±4%
Connections	SMA (P2010A2) BNC (P2010A1)
Ossila Four-Point Probe Compatibility	P2010A2 - T2001A4 (152.4 mm samples) P2010A1 - T2001A3 (76.2 mm samples)