Four-Point Probe Head
Electrical Test Boards, Equipment Accessories,
High-Quality Probes for Good Electrical Contact
Measure sheet resistance, resistivity, and conductivity with ease
Four-point probe heads for the Ossila Four-Point Probe that can be used to measure sheet resistance, resistivity, and conductivity.
The soft-tipped probe head features gold-coated probes to provide good electrical contact. These probes are rounded and spring loaded to reduce or eliminate damage to samples that can be caused by sharp probes whilst ensuring a uniform force of 60 grams is applied.
The sharped-tipped probe head is designed for materials with naturally forming oxide layers, with a tip diameter of 0.08 mm. The nickel-plated tungsten carbide tips can apply a maximum force of 197.43 gf to pierce the insulating layer for reliable sample measurements.
Please note: the soft-tipped probe head is not suitable for silicon or other materials which naturally form insulating oxide layers. The sharp-tipped probe head is designed for these materials.
If you need a replacement probe head for the T2001A3 model, please contact us.
Specifications
Soft-tipped Probe Head
| Probe Spacing | 1.27 mm (0.05") |
|---|---|
| Probe Radius | 0.24 mm |
| Probe Stroke | 1.4 mm |
| Spring Force | 25 - 60 grams |
| Maximum Current | 2 A |
| Measurement Error | ±4% |
| Probe Material | Gold- and nickel-plated brass alloy |
| Connections | SMA |
Sharp-tipped Probe Head
| Probe Spacing | 1.6 mm (0.063") |
|---|---|
| Probe Tip Diameter | 0.08 mm |
| Probe Stroke* | 1.19 mm |
| Force at Maximum Travel | 197.43 gf |
| Spring Constant | 159.22 gf/mm |
| Probe Material | Nickel-plated tungsten carbide |
| Connections | SMA |
*Exceeding the maximum probe stroke may damage or destroy the substrate.
Please note: Your Ossila Four-Point Probe will require screen firmware version 1.1.0 or newer to use the sharp-tipped probe head. You can download the latest firmware from our website.
