The Ossila lifetime test system is designed to enable users to perform statistical analysis of device lifetimes by collecting data from multiple devices at once. The test multiplexor system is designed to allow users with their own source measure unit and programming experience to develop customised testing procedures and algorithms. Available as both a stand alone unit for use with your own source measure unit or as a fully integrated turnkey test system with configurable user specifications, contact the Ossila office for more information.
The Ossila Multiplexing Lifetime Tester allows for faster testing and measurement of several devices at once. A fully enclosed multiplexing electronics system accompanying the board offers increased automation and speed for a variety of measurements. The array board allows for 8 devices each with 6 pixels on either the pixelated anode or pixelated cathode substrate systems. Each pixel has computer controlled electronic switching alongside 4 thermometers and 8 reference photodiodes.
At the heart of the board is a network of ultra-high specification transistors that allow the individual pixels across the array of substrates to be multiplexed onto a single BNC connector to attach to a variety of test equipment. The transistors are specified to have an extremely low on-state resistance.
The versatility of the system makes it ideal for a wide variety of experiments including current-voltage (JV) and current-voltage-light (JVL) sweeps and lifetime testing.
Components include: 8-substrate remote test board with temperature sensors, 8-device (with 6 pixels each) multiplexing electronics, LabVIEW multiplexing demo code.
- SIP sockets for easy attachment of devices
- High performance electronic pixels switches
- USB interface with easy integration to LabVIEW, MATLAB and others
- Compatible with Linux, Mac OS, Pocket PC and Windows
- On board temperature sensor
- On board reference photo-diode (optimised for visible response)
- Shutter control for external instruments
- M4, M6 and 1/4" mounting holes to make mounting on a variety of optical benches and other equipment quick and simple
Remote Substrate Board Specification
|Outer dimensions||100 mm x 100 mm typical but customisable|
|Substrate size||20 mm x 15 mm|
|Number of substrates||8|
|Pixels per substrate||Up to six|
|Maximum pixel size||0.5 cm2 (one pixel per substrate)|
|Compatible substrate designs||S101/S103/S171/S173|
|Thermometers||Up to eight (four in standard design)|
|Reference photodiodes||Up to eight|
|Connection cable||Twin IDC ribbon cables|
|Maximum voltage||±10 V|
|Maximum current||100 mA|
|On state resistance||0.2 Ω|
|Off state noise level||10 nA|
|Demonstration code||LabVIEW, Matlab|
The role of the hole-extraction layer in determining the operational stability of a polycarbazole:fullerene bulk-heterojunction photovoltaic device, E. Bovill et al., Appl. Phys. Lett. 106, 073301 (2015)
"We have shown that OPV devices utilising a PEDOT:PSS HTL have a higher stability than comparable devices using a MoOx or V2O5 HTLs, with extrapolated T80 lifetimes for devices utilising a PEDOT:PSS HTL being 14500h."
Solar Farm Lifetime Testing System
Recently Ossila was involved with Sheffield University's Solar Farm Project and was required to develop an outdoor PV Lifetime Testing System which is now installed on the Physics Department roof.
The system is comprised of three Multiplexing Lifetime Testers which are housed within a waterproof metal cabinet along with a PC and PXI. The Lifetime Testers' substrate boards are enclosed within three hermetically sealed Environmental & Encapsulation Chambers rigged to the top of the cabinet. The system is enabling long term field testing of photovoltaic cells and will contribute significantly to the collection of data at the solar farm.
- Photovoltaic (8 pixel) Substrate System
- Pixelated Anode Substrate System
- Pixelated Cathode Substrate System