Measurement Aperture Masks - S171 Substrates

Measurement aperture masks with electrochemically-etched holes to accurately define the active area of a pixel during measurement and to stop indirect/scattered light.

Useful for OPV measurements under solar simulators or OLEDs with luminance meters. For use with pixelated cathode substrates (S171) in the push fit test board (E371).

• E361 is designed for use with the single large area pixel.
• E362 is designed for use with six small pixels for most general measurements where the scattered light between pixels (typically less than 1%) is not an issue.
• E363 provides a set of three masks such that individual pixels can be masked.

Datasheet

To the best of our knowledge, the information provided here is accurate. However, Ossila assume no liability for the accuracy of this information. The values provided here are typical at the time of manufacture and may vary over time and from batch to batch.