Measurement Aperture Mask, 20 x 15 mm (Legacy, Generation II)
Measurement aperture masks with electrochemically-etched holes to accurately define the active area of a pixel during measurement and to stop indirect/scattered light.
Useful for OPV measurements under solar simulators or OLEDs with luminance meters. For use with pixelated cathode substrates (S171) in the push fit test board (E371).
- E361 is designed for use with the single large area pixel.
- E362 is designed for use with six small pixels for most general measurements where the scattered light between pixels (typically less than 1%) is not an issue.
- E363 provides a set of three masks such that individual pixels can be masked.
There is a newer version of this product. Our generation I and II substrates and masks will be discontinued soon and are only available while stocks last. Please contact us for further details.
Datasheet
| Outer dimensions | 20 mm x 15 mm |
| Apertures |
1 x 72.96 mm2 6 x 2.56 mm2 |
| Aperture tolerance | ±5% |
To the best of our knowledge the information provided here is accurate. However, Ossila assume no liability for the accuracy of this page. The values provided are typical at the time of manufacture and may vary over time and from batch to batch. All products are for laboratory and research and development use only, and may not be used for any other purpose including health care, pharmaceuticals, cosmetics, food or commercial applications.