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Measurement Aperture Mask, 20 x 15 mm (Legacy, Generation I)

Solar Cell Prototyping Platform, Substrates and Fabrication


Product Code E141
Price $100 ex. VAT

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A measurement aperture mask with electrochemically-etched holes to define the active area of a pixel during measurement and to stop indirect/scattered light when using our connection boards. Useful for OPV measurements under solar simulators or OLEDs with luminance meters. For use with our pixelated anode OPV/OLED substrates (S101).

There is a newer version of this product. Our generation I and II substrates and masks will be discontinued soon and are only available while stocks last. Please contact us for further details.

Connection ZIF: E141
Push-fit: E142
Outer dimensions 40 mm × 40 mm (E141)
15 mm × 20 mm (E142)
Apertures 6 × 0.0212cm2 (E141)
Aperture tolerance ±5%

To the best of our knowledge the information provided here is accurate. The values provided are typical at the time of manufacture and may vary over time and from batch to batch. Products may have minor cosmetic differences (e.g. to the branding) compared to the photos on our website. All products are for laboratory and research and development use only.

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