Measurement Aperture Mask for Pixelated Anode Substrates
Order Code: E141
A measurement aperture mask with electrochemically-etched holes to define the active area of a pixel during measurement and to stop indirect/scattered light when using our connection boards. Useful for OPV measurements under solar simulators or OLEDs with luminance meters. For use with our pixelated anode OPV/OLED substrates (S101).
| Connection |
ZIF: E141 Push-fit: E142 |
| Outer dimensions | 40 mm × 40 mm (E141) 15 mm × 20 mm (E142) |
| Apertures | 6 × 0.0212cm2 (E141) |
| Aperture tolerance | ±5% |
To the best of our knowledge, the information provided here is accurate. However, Ossila assume no liability for the accuracy of this information. The values provided here are typical at the time of manufacture and may vary over time and from batch to batch.