Test & Measure
Test and measurement boards for Perovskite, OPV, OFET, graphene and sensing.
Xtralien: Precision Test & Measurement
X100 Source Measure Unit (Source Meter)
Xtralien X100 Product Description - Source Measure Unit The Xtralien X100 incorporates two source measure units (source-meters) and two precision voltage meters. It is capable of measuring a wide range of research devices including photovoltaics, LEDs and OLEDs, transistors and more.
PV and OLED Test Boards
A collection of manual and computer control test board and measurement equipment for PV and OLED.
ZIF Test Board for Pixelated Anode SubstratesFrom £149
Push Fit Test Board for Photovoltaic Substrates (8 pixel)From £249
Push-Fit Test Board for Pixelated Anode SubstratesFrom £249
Smart PV and OLED Board with Easy JV Sweep SoftwareFrom £980
OFET Test & Measurement Equipment
A collection of manual test boards, probe station, and an automatic measurement suite for measuring and characterising organic and thin film transistors.
OFET Test Board for Low Density OFETsFrom £249
OFET Test Board for High Density OFETsFrom £699
Multiplexor for Mobility Testing and Sensing (Low Density Substrates)From £3,900
Multiplexor for Mobility Testing and Sensing (High Density Substrates)From £4,900
Probe Station and Four-Point Probe Measurement
A multipurpose and user-friendly probe station for device characterization and sheet resistance measurement.
OFET Test Board for High Density OFETs
The Ossila High Density OFET Test Board has been designed to enable quick, easy and reliable testing of up to 20 devices. It is compatible with our High Density OFET Fabrication System as well as with our Prefabricated High Density Substrates.
A multi-purpose probe station, to simplify and speed up measurement. By using interchangeable probes, pre-aligned for a variety of substrate architectures, it becomes quicker and easier to measure: OFET & TFT mobility, Chremiresistor & chemiFET sensors, Sheet resistance and four point probe characterisation, Graphene and 2D characterisation (IV curves and field effect measurements).
PV and OLED Lifetime and Environmental Degradation Testing
Equipment designed with the capability of running lifetime environmental degradation testing.
OLED Lifetime System
Xtralien OLED Lifetime System Combining the precision of the Xtralien X100 with the versatility of an Ossila Test Board provides a robust and user-friendly OLED lifetime testing system. The lifetime system is designed to provide a long-term and low-cost solution to lifetime testing. Compatibility with both the 8-pixel and 6-pixel Ossila substrate systems enables the user to easily fabricate and test OLED...
Smart PV and OLED Board with Easy JV Sweep Software
This measurement system is designed to enable OLED and PV testing and characterisation via intuitive Easy JV Sweep software. Comprised of a main multiplexor board, an interchangeable and customisable substrate board, and control software, the system allows academics and researchers to conduct a number of measurements
Environmental and Encapsulation Chambers
Designed for long term experiments, our Environmental & Encapsulation Chamber provides a hermetically sealed environment suitable for outdoor lifetime testing, gas sensing and degradation studies.
Photovoltaic Life Time Testing Multiplexer
The Ossila lifetime test system is designed to enable users to perform statistical analysis of device lifetimes by collecting data from multiple devices at once.
Turnkey OFET Characterisation System
A turnkey characterisation system for OFETs, TFTs etc easy to set up and ready to use without the need of learning any programming languages.