Sheet Resistance Software

This is the latest version of the sheet resistance measurement software for the Ossila Four-Point Probe System.

Latest Version

Software Version File Size Download
Ossila Sheet Resistance 40 MB

Minimum System Requirements

Operating System Windows Vista, 7, 8, or 10 (32-bit or 64-bit)
CPU Dual Core 2 GHz
Available Hard Drive Space 165 MB
Monitor Resolution 1440 x 900
Connectivity USB 2.0, or Ethernet (requires DHCP)

Version History

Version Changes
  • Changed results to display using SI prefixes instead of SI notation.
  • I-V and settings data now saved to subfolders.
  • I-V measurements now checked for linearity to improve measurement accuracy.
  • Fixed a bug that would cause the program to crash if too small sample sizes were entered.
  • Improved plotting and measurement speed.
  • Fixed a bug that caused the thickness correction factor to be incorrect.
  • Changed the 'Experiment Name' field to 'Sample Name'.
  • Updated how data is saved in the backend, as well as the naming convention used.
    • Files are now saved in the chosen directory instead of a new folder.
    • File names now start with the chosen sample name.
    • File names no longer include the date and time.
    • If a file with the chosen name already exists in the specified directory a number will be added to the end of the file name.
  • Fixed a bug that limited the long edge field to 140 mm, and the short edge field to 70 mm.
    • Both fields (and diameter) now have a maximum of 600 mm.
  • Fixed a bug that prevented negative voltages from being used in the maximum voltage field.
  • Moved the directory selection button to the directory field.
  • Updated the colour scheme of the UI to lighter theme.
  • The save directory is now included in settings profiles.
  • Fixed a bug that prevented the user creating settings profiles.
  • Fixed a bug that caused the program to crash when measuring sheet resistances of 0 Ω/square.
  • Warnings now clear after 10 seconds.
  • The measurement now cancels if:
    • The current limit is reached for the select range.
    • There are less than 3 data points in the initial IV measurement.
  • Major update to the user interface to improve consistency with other software.
  • Settings profile options are now with the "Measure" and "Cancel" buttons.
  • "Range" and "Samples per Point" options are now with the system connection options.
  • Updated the software to work on 32-bit Windows PCs.

The software has been updated to work with the new version of the Four-Point Probe System.

  • The maximum current values have been increased to the following:
    • Range 1: increased from 100 mA to 150 mA.
    • Range 2: increased from 10 mA to 20 mA.
    • Range 3: increased from 1000 μA to 2000 μA.
    • Range 4: increased from 100 μA to 200 μA.
    • Range 5: increased from 10 μA to 20 μA.
  • An option to set probe spacing has been added to allow different probe heads to be used.
  • Added the ability to perform measurements with negative target currents.
  • Increased the maximum sample thickness from 5000 μm to 10000 μm.
  • Updated the software to work with the Source Measure Unit - X200.
  • The user can now save settings profiles in the software.
  • Increased the maximum sample thickness from 500 μm to 5000 μm.
  • Changed the default save directory to the current user directory.
  • Added the ability to automatically save measurement data when the measurement finishes.