Measurement Aperture Mask, 20 x 15 mm (Legacy, Generation I)
A measurement aperture mask with electrochemically-etched holes to define the active area of a pixel during measurement and to stop indirect/scattered light when using our connection boards. Useful for OPV measurements under solar simulators or OLEDs with luminance meters. For use with our pixelated anode OPV/OLED substrates (S101).
There is a newer version of this product. Our generation I and II substrates and masks will be discontinued soon and are only available while stocks last. Please contact us for further details.
| Connection |
ZIF: E141 Push-fit: E142 |
|---|---|
| Outer dimensions | 40 mm × 40 mm (E141) 15 mm × 20 mm (E142) |
| Apertures | 6 × 0.0212cm2 (E141) |
| Aperture tolerance | ±5% |
To the best of our knowledge the information provided here is accurate. However, Ossila assume no liability for the accuracy of this page. The values provided are typical at the time of manufacture and may vary over time and from batch to batch. All products are for laboratory and research and development use only, and may not be used for any other purpose including health care, pharmaceuticals, cosmetics, food or commercial applications.