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Four-Point Probe Head

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Product Code P2010A1
Price $188 ex. VAT

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A four-point probe head for the Ossila Four-Point Probe System that can be used to measure sheet resistance, resistivity, and conductivity.

The probe head features gold-coated probes to provide good electrical contact. These probes are rounded and spring loaded to reduce or eliminate damage to samples that can be caused by sharp probes whilst ensuring a uniform force of 60 grams is applied.

Schematic diagram of the probes of the Four-Point Probe Head
Schematic diagram of the probes of the Four-Point Probe Head.

Please note, this probe head is not suitable for silicon or other materials which naturally form insulating oxide layers. To measure such materials, the oxide layer needs to be penetrated by the probes, which may not be possible with the spring-loaded, round tipped probes utilised by this probe head.


Probe Spacing 1.27 mm
Probe Radius 0.24 mm
Probe Stroke 1.4 mm
Spring Force 25 - 60 grams
Connections BNC

To the best of our knowledge the information provided here is accurate. However, Ossila assume no liability for the accuracy of this page. The values provided are typical at the time of manufacture and may vary over time and from batch to batch. Products may have minor cosmetic differences (e.g. to the branding) compared to the photos on our website. All products are for laboratory and research and development use only, and may not be used for any other purpose including health care, military, pharmaceuticals, cosmetics, food, or commercial applications.

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