New Guide Available: Sheet Resistance Measurements of Thin Films
Posted on Tue, Mar 13, 2018 by Ashley Wong
An important characteristic of various materials, sheet resistance (a.k.a. surface resistivity) quantifies the ability for electric charges to move along uniform thin films. Knowing the sheet resistance of a material allows you to calculate its resistivity and conductivity - and thus enables you to electrically characterise the material.
Four-point probes are the most common piece of equipment used to carry out this measurement. However, most four-point probes on the market use sharp needles as probes, which are likely to damage delicate thin films and reduce the accuracy of sheet resistance measurements. Ossila's Four-Point Probe overcomes this issue by using spring-loaded probes with round tips and a precision vertical translation micrometre-operated stage that ensures gentle, controlled contact with the thin-film.
Author: Ashley Wong
Hailing from a Psychology background, Ashley has an MSc in Organizational/Work Psychology from the Sheffield University Management School. Prior to joining Ossila, Ashley worked with two multi-national organizations, researching emotional labour in the life insurance industry. In 2017, she successfully led the process of writing & applying for a prestigious Institute of Physics Business Innovation Award, which resulted in Ossila winning its first-ever industrial award.