OPV Lifetimes of Over 14,000 Hours Achieved with Help of Ossila Lifetime Tester

Posted on Tue, Feb 24, 2015 by Jack Stephenson

Congratulations to Ed Bovill and the rest of the team behind the latest paper The role of the hole-extraction layer in determining the operational stability of a polycarbazole: fullerene bulk-heterojunction photovoltaic device. Building on previous work on purity and process engineering by studying the effect of different interface layers, extrapolated device lifetimes in excess of 14,000 hours have been produced.

One of the key enablers of this work was the ability to collect statistically relevant data by using the Ossila Lifetime Multiplexor System to measure the lifetime of multiple devices simultaneously - a technology that is also being used to collect real-world lifetime from the Sheffield Solar Farm. One of the key findings was that many of the new hole extraction layers that have been extensively studied over the last few years do not translate into longer lifetimes and that the tried and tested AI 4083 PEDOT:PSS is still one of the best interface layers for long term stability.

If you have any questions or thoughts about this paper or would like further information on its results or the Ossila products used, please get in touch with our R&D team via our contact form.