Ossila OFET test board
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The Ossila OFET test board is designed to work with our pre-patterned substrates to eliminate the need for probe stations and make electrical contact to devices quick and simple.
| Order code | Quantity | Price |
| E222 |
1 |
£249 |
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The Ossila OFET test board has been designed in tandem with the Ossila prepatterned ITO OFET substrates (S161) such that finished OFETs can simply be dropped into the testing slot with a push-fit connector. Switches control the connections to the five individual OFETs on a substrate allowing testing of a device at the flick of a switch.
Two BNC connectors make it easy to connect the source/drain and gates to a wide array of test equipment with a common earth used to eliminate ground-loop currents.
An optical window allows access for photosensitivity, photodoping and sensing measurements and metric/imperial mounting holes are provided for use with standard optical tables. The entire board is also compact at just 100 mm square to allow for easy use in a glovebox.
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Typically OFET measurements are made using two source measure units with one used to set the gate voltage and measure any gate leakage current and the second used to sweep either the source (n-type) or drain (p-type) voltage and measure the current. The third terminal (drain/source for n-type/p-type respectively) is then usually grounded.
The Ossila S161 substrates contain five OFETs with individual source-drain connections and a common gate. The substrate is contacted by gold coated spring-loaded connectors with a push fit lid used to ensure that there is an easy and reliable electrical contact.
The test board has been designed with maximum experimental versatility in mind and has the following features:
- Twin BNC connectors for easy attachment to source measure units (SMUs). Channel A is used for the source or drain connection while channel B measures the gate connection.
- A common ground is provided to ensure that the two SMUs are kept at equipotential and elimiate any earth-loop currents that can otherwise be formed - important for nanoamp range measurements.
- Gate connection switches to activeate the gate connection to Channel B. A common gate is used for all five OFETs.
- Device sense switches to connect the source (n-type) or drain (p-type) contacts of the five individual OFETs to Channel A.
- Device ground switches to connect the third terminal to earth.
- Optical window for experimental access. Can be used to either illuminate devices for sensing/doping experiments or microscope inspection or a wide array of optoelectrical measurements.
- Easy access test connectors are typically used with multimeters for continuity and isolation testing.
Ossila OFET test board demonstration video
OLED/OPV components
PCDTBT, P3HT, PCBM and PEDOT:PSS.
OFET components
OLED/OPV overview
OFET overview
