Ossila OLED/OPV test board
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The Ossila OLED/OPV test board is designed to make testing and experimenting with Ossila's standard substrates as easy as possible. The zero insertion force (ZIF) socket allows for easy attachment and removal of devices while the BNC socket makes connecting experimental apparatus simple.
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The window in the centre also allows for experiments where optical access is required from both sides. Meanwhile the M4, M6 and 1/4" mounting holes makes mounting on a variety of optical benches and other equipment quick and simple (insulating plastic M6 bolts included).
Used for a wide variety of experiments including:• Photovoltaic current-voltage (IV) sweeps
• Photovoltaic external quantum efficiency measurements
• Photovoltaic lifetime testing
• OLED current-voltage-light (IVL) sweeps
• OLED lifetime testing
1) BNC socket for easy connection to test equipment
2) Header pins for easy electrical access (great for initial tests/checks with a multimeter)
3)Zero insertion force (ZIF) socket to easily connect and remove devices made using Ossila's standard substrates
4)Window to allow optical access from both sides (for experiments such as pump-probe excitement with simultaneous electrical measurements)
5)Cathode switch (can use to switch all pixels on/off)
6)Switches for the individual pixels
7)Oval bolt holes to accommodate either M6 bolts or 1/4" bolts for mounting on standard metric or imperial optical benches (insulating plastic M6 bolts included).
Ossila OLED/OPV Test board demonstration video
OLED/OPV components
PCDTBT, P3HT, PCBM and PEDOT:PSS.
OFET components
OLED/OPV overview
OFET overview
